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Publication details

Publication CODE Title
IEC 60749-41:2020 (2020-07) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 41: STANDARD RELIABILITY TESTING METHODS OF NON-VOLATILE MEMORY DEVICES
 
Price Excl. VAT Total number of pages, tables and drawings
159.00 € 44.
Description
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2020-07-22
ICS-Code (International Standards Classification) 31.080.01
NBN Status New
IEC publication date 2020-07-22
IEC stability date 2027-12-31
IEC file modification date 2020-07-22
IEC last modification date 2020-07-22