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Publication details

Publication CODE Title
IEC PAS 62175:2000 (2000-08) MARKING PERMANENCY TEST METHOD
 
Price Excl. VAT Total number of pages, tables and drawings
21.00 € 5.
Description
Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN version
Status
Status IEC PUBLICATION
Situation Withdrawn
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2000-08-24
ICS-Code (International Standards Classification) 35.040
NBN Status New
IEC publication date 2000-08-24
IEC last modification date 2009-08-18