Publication CODE |
Title |
IEC 62899-503-1:2020 (2020-05) |
PRINTED ELECTRONICS - PART 503-1: QUALITY ASSESSMENT - TEST METHOD OF DISPLACEMENT CURRENT MEASUREMENT FOR PRINTED THIN-FILM TRANSISTOR |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
85.00 €
|
15. |
Description
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
|
Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
Status |
IEC PUBLICATION |
Situation |
Currently active
|
|
Committee |
TC 119
PRINTED ELECTRONICS
|
Responsible |
Monsieur DE LEEUW Thierry, Technical Officer
Diamant Building
Bd Auguste Reyers, 80
1030
BRUXELLES
Phone: +32 2 706 85 72
E-mail: thierry.deleeuw@ceb-bec.be
|
BEC Approval |
2020-05-27 |
ICS-Code (International Standards Classification) |
29.045
, 31.080.30
|
NBN Status |
New |
|
IEC publication date |
2020-05-27 |
IEC stability date |
2025-12-31 |
IEC file modification date |
2020-05-27 |
IEC last modification date |
2020-05-27 |
|