| Publication CODE |
Title |
| IEC TS 62607-9-1:2021 (2021-10) |
NANOMANUFACTURING - KEY CONTROL CHARACTERISTICS - PART 9-1: TRACEABLE SPATIALLY RESOLVED NANO-SCALE STRAY MAGNETIC FIELD MEASUREMENTS - MAGNETIC FORCE MICROSCOPY |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
366.00 €
|
63. |
Description
IEC TS 62607-9-1:2021(E) establishes a standardized method to characterize spatially varying magnetic fields with a spatial resolution down to 10 nm for flat magnetic specimens by magnetic force microscopy (MFM). MFM primarily detects the stray field component perpendicular to the sample surface. The resolution is achieved by the calibration of the MFM tip using magnetically nanostructured reference materials.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 113
NANOTECHNOLOGY STANDARDISATION FOR ELECTRICAL AND ELECTRONIC PRODUCTS AND SYSTEMS
|
| BEC Approval |
2021-10-14 |
| ICS-Code (International Standards Classification) |
07.120
|
| NBN Status |
New |
|
| IEC publication date |
2021-10-14 |
| IEC stability date |
2024-12-31 |
| IEC file modification date |
2021-10-14 |
| IEC last modification date |
2021-10-14 |
|
