| Publication CODE |
Title |
| IEC 63284:2022 (2022-04) |
SEMICONDUCTOR DEVICES - RELIABILITY TEST METHOD BY INDUCTIVE LOAD SWITCHING FOR GALLIUM NITRIDE TRANSISTORS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
25. |
Description
IEC 63284:2022 covers the protocol of performing a stress procedure and a corresponding test method to evaluate the reliability of gallium nitride (GaN) power transistors by inductive load switching, specifically hard-switching stress
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2022-04-21 |
| ICS-Code (International Standards Classification) |
31.080.30
|
| NBN Status |
New |
|
| IEC publication date |
2022-04-21 |
| IEC stability date |
2026-12-31 |
| IEC file modification date |
2022-04-21 |
| IEC last modification date |
2022-04-21 |
|
